Y.-N. Shen

Design for testability techniques for CMOS combinational gates

Fabrizio Lombardi, Donatella Sciuto, Giacomo Buonanno, 1991 .

FFT architecture for WSI with concurrent error detection and fault location

Fabrizio Lombardi, Jon C. Muzio, Y.-N. Shen, 1992 .

Concurrent built-in self-test with reduced fault latency

Fabrizio Lombardi, Y.-N. Shen, 1991, [Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems.