Frédéric Barbier

Correlation between EOS customer return failure cases and Over Voltage Stress (OVS) test method

Christian Gautier, Jean Luc Lefebvre, Frédéric Barbier, 2009, Microelectron. Reliab..

Circuit of image sensor pixel

Frédéric Barbier, Francois Roy, 2009 .

Versatile method for optical performances characterization of off-axis CMOS pixels with microlens radial shift

Flavien Hirigoyen, Jérôme Vaillant, Didier Hérault, 2008, Electronic Imaging.

ESD sensitivity investigation on a wide range of high density embedded capacitors

Frédéric Barbier, Sebastien Jacqueline, S. Jacqueline, 2008, Microelectron. Reliab..