F.J. Henley

Test head design using electrooptic receivers and GaAs pin electronics for a gigahertz production test system

F.J. Henley, H.-J. Choi, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

An ultra high speed test system

F.J. Henley, 1989, IEEE Design & Test of Computers.