Hervé Deslandes

Time-integrated photon emission as a function of temperature in 32 nm CMOS

Franco Stellari, Alan J. Weger, Peilin Song, 2015, 2015 IEEE International Reliability Physics Symposium.

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization

Rudolf Schlangen, S. Li, K. Yu, 2010, Microelectron. Reliab..

Limitations to photon-emission microscopy when applied to "hot" devices

Ted Lundquist, Hervé Deslandes, H. Deslandes, 2003, Microelectron. Reliab..