A. P. Zankovich

发表

Nondestructive RAM Testing by Analyzing the Output Data for Symmetry

V. N. Yarmolik, A. P. Zankovich, 2003 .

Automatic generation of symmetric transparent March memory tests

V. N. Yarmolik, A. P. Zankovich, B. Sokol, 2003, The Experience of Designing and Application of CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference..