Jean-Jacques Hajjar
发表
Sirui Luo,
Javier A. Salcedo,
Jean-Jacques Hajjar,
2014,
IEEE Electron Device Letters.
Jean-Jacques Hajjar,
Alan Righter,
Ed Wolfe,
2014,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.
Jean-Jacques Hajjar,
Yuanzhong Paul Zhou,
Srivats Parthasarathy,
2018,
2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Javier A. Salcedo,
Jean-Jacques Hajjar,
Srivatsan Parthasarathy,
2013,
2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).
Sirui Luo,
Javier A. Salcedo,
Jean-Jacques Hajjar,
2014,
IEEE Transactions on Device and Materials Reliability.
Jean-Jacques Hajjar,
Thorsten Weyl,
2007
.
Sirui Luo,
Javier A. Salcedo,
Jean-Jacques Hajjar,
2015,
2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC).
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2015,
Microelectron. Reliab..
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2014,
Microelectron. Reliab..
Jean-Jacques Hajjar,
Elyse Rosenbaum,
Srivatsan Parthasarathy,
2020,
2020 42nd Annual EOS/ESD Symposium (EOS/ESD).
Javier A. Salcedo,
Jean-Jacques Hajjar,
2017
.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Juin J. Liou,
2010,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010.
Javier A. Salcedo,
Jean-Jacques Hajjar,
James Zhao,
2016,
2016 IEEE International Reliability Physics Symposium (IRPS).
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2012,
Microelectron. J..
Jean-Jacques Hajjar,
Yuanzhong Zhou,
J J Liou,
2010,
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010.
Sirui Luo,
Javier A. Salcedo,
Jean-Jacques Hajjar,
2017,
Microelectron. Reliab..
Sirui Luo,
Javier A. Salcedo,
Jean-Jacques Hajjar,
2014,
IEEE Transactions on Device and Materials Reliability.
Wei Liang,
Javier A. Salcedo,
Jean-Jacques Hajjar,
2017,
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2015
.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2009,
2009 IEEE International Reliability Physics Symposium.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2009,
2009 31st EOS/ESD Symposium.
Hang Li,
Javier A. Salcedo,
Jean-Jacques Hajjar,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Jean-Jacques Hajjar,
Yuanzhong Zhou,
Juin J. Liou,
2013,
Microelectron. Reliab..
Jean-Jacques Hajjar,
S. Malobabic,
J. J. Liou,
2012,
IEEE Electron Device Letters.
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2014,
2014 IEEE International Conference on Electron Devices and Solid-State Circuits.
Jean-Jacques Hajjar,
Yuanzhong Zhou,
Thorsten Weyl,
2011,
EOS/ESD Symposium Proceedings.
Jean-Jacques Hajjar,
J. A. Salcedo,
S. Parthasarathy,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Jean-Jacques Hajjar,
Alan Righter,
Ed Wolfe,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Javier A. Salcedo,
Jean-Jacques Hajjar,
Srivatsan Parthasarathy,
2014,
2014 IEEE International Reliability Physics Symposium.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2015,
Microelectron. Reliab..
Javier A. Salcedo,
Jean-Jacques Hajjar,
Srivatsan Parthasarathy,
2015,
2015 IEEE International Reliability Physics Symposium.
Jean-Jacques Hajjar,
Yuanzhong Zhou,
Alan W. Righter,
2013,
2013 IEEE 10th International Conference on ASIC.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Juin J. Liou,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Javier A. Salcedo,
Jean-Jacques Hajjar,
Juin J. Liou,
2016,
IEEE Transactions on Device and Materials Reliability.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Srivatsan Parthasarathy,
2017,
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Jean-Jacques Hajjar,
Dave Clarke,
Yuanzhong Paul Zhou,
2018,
2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Jean-Jacques Hajjar,
Yuanzhong Zhou,
Alan W. Righter,
2010,
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.
Hang Li,
Javier A. Salcedo,
Jean-Jacques Hajjar,
2018,
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Jean-Jacques Hajjar,
2008
.
Jean-Jacques Hajjar,
Juin J. Liou,
Slavica Malobabic,
2009,
2009 IEEE International Reliability Physics Symposium.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Juin J. Liou,
2015,
IEEE Transactions on Electron Devices.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2018,
2018 18th International Workshop on Junction Technology (IWJT).
Jean-Jacques Hajjar,
S. Parthasarathy,
J. A. Salcedo,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Javier A. Salcedo,
Jean-Jacques Hajjar,
Srivatsan Parthasarathy,
2014,
2014 IEEE International Reliability Physics Symposium.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Juin J. Liou,
2016,
IEEE Electron Device Letters.
Javier A. Salcedo,
Jean-Jacques Hajjar,
Yuanzhong Zhou,
2019,
IEEE Transactions on Device and Materials Reliability.
Jean-Jacques Hajjar,
S. Feindt,
J. Lapham,
1992,
Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting.