Romualdo A. Ferreyra

Microwave performance of AlGaN/AlN/GaN-based single and coupled channels HFETs

Hadis Morkoç, Ümit Özgür, Xiang Li, 2013, Photonics West - Optoelectronic Materials and Devices.

Measurements of off-state electrical stress in InAlN/AlN/GaN heterostructure field-effect transistors with varying In compositions

Hadis Morkoç, Ümit Özgür, Cemil Kayis, 2012, OPTO.

Degradation analysis of InAlN/AlN/GaN heterostructure field-effect transistors using low-frequency noise and current-transient methods: hot-phonon effects

Hadis Morkoç, Ümit Özgür, Xiang Li, 2012, OPTO.

Investigation of microwave and noise properties of InAlN/GaN HFETs after electrical stress: role of surface effects

Hadis Morkoç, Ümit Özgür, Fan Zhang, 2013, Photonics West - Optoelectronic Materials and Devices.

Degradation in InAlN/AlN/GaN heterostructure field-effect transistors as monitored by low-frequency noise measurements: Hot phonon effects

Hadis Morkoç, Xiang Li, Ümit Özgür, 2011 .

Degradation and phase noise of InAlN/AlN/GaN heterojunction field effect transistors: Implications for hot electron/phonon effects

Hadis Morkoç, Xiang Li, Ümit Özgür, 2012 .