Ben Bennetts

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Essential reading for the basics and implementation of boundary scan: Parker, K PThe boundary-scan handbook Kluwer Academic, Dordrecht, The Netherlands (1992) ISBN 0 7923 9270 1, £48.00/Dfl. 160.00, pp 282

Ben Bennetts, B. Bennetts, 1993, Microprocessors and microsystems.

Digital test text caters for academia and researchers: Hideo Fujiwara 'Logic testing and design for testability' MIT Press, Cambridge, MA, USA (1985) £34.95 pp x + 284

Ben Bennetts, 1986, Microprocess. Microsystems.

Fault Diagnosis of Digital Systems - a Review

Ben Bennetts, D. W. Lewin, 1971, Computer.

Scan Technology at Work

Ben Bennetts, 1991, Fault-Tolerant Computing Systems.

Fault Diagnosis of Digital Systems - a Review

Ben Bennetts, D. W. Lewin, B. Bennetts, 1971, Computer.

Recent Developments in the Theory and Practice of Testable Logic Design*

Ben Bennetts, Roy V. Scott, 1976, Computer.

Macro Testability; The Results of Production Device Applications

Ben Bennetts, Frank Bouwman, Steven Oostdijk, 1992, Proceedings International Test Conference 1992.

IJTAG (internal JTAG): a step toward a DFT standard

Jeff Rearick, Ben Bennetts, Alfred L. Crouch, 2005, IEEE International Conference on Test, 2005..

Status of IEEE testability standards 1149.4, 1532 and 1149.6

Adam Osseiran, Ben Bennetts, Stephen K. Sunter, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

Builtlln Self=Te Assuring Integrity

Benoit Nadeau-Dostie, Ben Bennetts, Bernd Konemann, 1996 .

IEEE P1687: Toward Standardized Access of Embedded Instrumentation

Jeff Rearick, Mike Ricchetti, Ben Bennetts, 2006, 2006 IEEE International Test Conference.

Review of software tools to support computer-aided testing of digital circuits

Ben Bennetts, 1986 .

Tutorial. Computer aids in engineering—a tutorial series

Ben Bennetts, B. Bennetts, 1988 .

Boundary Scan: The Internet of Test

Adam W. Ley, Ben Bennetts, Mike Wondolowski, 1999, IEEE Des. Test Comput..

An Improved Method of Prime C-Class Derivation in the State Reduction of Sequential Networks

Ben Bennetts, 1971, IEEE Transactions on Computers.

Progress in DFT: A Personal View

Ben Bennetts, B. Bennetts, 1992, International Test Conference.

Guest Editor's Introduction

Ben Bennetts, 1995, IEEE Des. Test Comput..

IEEE standard 1149.1-1990 on boundary scan: History, literature survey, and current status

Ben Bennetts, A. Osseyran, 1991, J. Electron. Test..

A realistic approach to detection test generation for combinatorial logic circuits

Ben Bennetts, 1972, Comput. J..

Built-In Self-Test: Assuring System Integrity

Najmi T. Jarwala, Benoit Nadeau-Dostie, Ben Bennetts, 1996, Computer.

Guest Editors' Introduction: Board Test

Ben Bennetts, Monica Lobetti Bodoni, 2003, IEEE Des. Test Comput..

HITEST - using knowledge in test generation

Ben Bennetts, Colin Maunder, 1985 .

Test Technology in Europe

Ben Bennetts, B. Bennetts, 1990, IEEE Design & Test of Computers.

Fault tolerance and digital systems

Ben Bennetts, 1979, Microprocess. Microsystems.

Electronics Design-for-Test: Past, Present and Future

Ben Bennetts, 2007, 12th IEEE European Test Symposium (ETS'07).

Minimizing pattern count for interconnect test under a ground bounce constraint

Erik Jan Marinissen, Henk D. L. Hollmann, Ben Bennetts, 2003, IEEE Design & Test of Computers.

Guest Editors' Introduction: Test and the Product Life Cycle

Ben Bennetts, Tony Ambler, 1999, IEEE Des. Test Comput..

New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG)

Ben Bennetts, Bill Eklow, B. Eklow, 2006, Eleventh IEEE European Test Symposium (ETS'06).