M. Togo

Positive bias temperature instabilities on sub-nanometer EOT FinFETs

Guido Groeseneken, Moonju Cho, E. San Andrés, 2011, Microelectron. Reliab..

Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements

Massimo Alioto, Naoto Horiguchi, Guido Groeseneken, 2012, IEEE Transactions on Circuits and Systems II: Express Briefs.

Low-frequency noise assessment of the transport mechanisms in SiGe channel bulk FinFETs

Naoto Horiguchi, Cor Claeys, Eddy Simoen, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).