Ezra Baruch

Device and process for testing circuits integrated

Michael Priel, Ezra Baruch, Dan Kuzmin, 2006 .

Investigation of on-chip PLL irregularities under stress conditions - case study

Sergey Sofer, Yoav Weizman, Ezra Baruch, 2004, Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004..

A simple system for on-die measurement of atto-Farad capacitance

Yoav Weizman, Ezra Baruch, Shai Shperber, 2011, 2011 IEEE ICMTS International Conference on Microelectronic Test Structures.