Alberto Mancaleoni

Analysis of Cu-wire pull and shear test failure modes under ageing cycles and finite element modelling of Si-crack propagation

Mauro Madia, Stefano Beretta, Stefano Mazzei, 2014, Microelectron. Reliab..

Qualification extension of automotive smart power and digital ICs to harsh aerospace mission profiles: Gaps and opportunities

Giovanna Mura, Matteo Medda, Alberto Mancaleoni, 2017, Microelectron. Reliab..