M. Sedlak

Machine Condition Monitoring, Part 2: Using Order Analysis for Condition Monitoring

M. Sedlak, 2003 .

Optimal entanglement-assisted discrimination of quantum measurements

M. Sedlak, J. Fiurasek, M. Mikova, 2014 .

Process-fidelity estimation of a linear optical quantum-controlled-Z gate: A comparative study

M. Sedlak, J. Fiurasek, M. Mikova, 2014 .