E. R. Heller

Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps

A. Sasikumar, S. A. Ringel, A. R. Arehart, 2015, Microelectron. Reliab..

Performance of commercial foundry-level AlGaN/GaN HEMTs after hot electron stressing

B. S. Poling, E. R. Heller, J. L. Brown, 2015, Microelectron. Reliab..

Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN

A. Sasikumar, S. A. Ringel, A. R. Arehart, 2016, Microelectron. Reliab..

Electro-thermal modeling of multifinger AlGaN/GaN HEMT device operation including thermal substrate effects

A. Crespo, E. R. Heller, A. Crespo, 2008, Microelectron. Reliab..

Thermometry of AlGaN/GaN HEMTs Using Multispectral Raman Features

R. Vetury, E. R. Heller, Sukwon Choi, 2013, IEEE Transactions on Electron Devices.