D. Becher
发表
M. Agostinelli,
S. Natarajan,
S. Ramey,
2015,
2015 IEEE International Reliability Physics Symposium.
M. D. Giles,
S. Mudanai,
K. J. Kuhn,
2011,
IEEE Transactions on Electron Devices.
S. Natarajan,
M. D. Giles,
S. Mudanai,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
Predictive compact modeling of NQS effects and thermal noise in 90nm mixed-signal/RF CMOS technology
S. Mudanai,
Wei-Kai Shih,
P. Packan,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
D. Becher,
M. Feng,
D. Becher,
1999,
IEEE Electron Device Letters.
P. Packan,
M. Hattendorf,
I. Post,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
Milton Feng,
Shyh-Chiang Shen,
JianJang Huang,
2000,
2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017).
D. Becher,
T. Mule,
P. Moon,
2008,
2008 International Interconnect Technology Conference.
Martin Weiss,
P. Hentges,
Saurabh Agrawal,
2009,
2009 IEEE International Interconnect Technology Conference.
Wei-Kai Shih,
D. Becher,
K. Kuhn,
2004,
2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535).