Friedrich Taenzler
发表
Kenneth M. Butler,
Bruce C. Kim,
Sukeshwar Kannan,
2013,
J. Electron. Test..
Abhijit Chatterjee,
Friedrich Taenzler,
Ganesh Srinivasan,
2006,
Proceedings of the Design Automation & Test in Europe Conference.
Bruce C. Kim,
Sukeshwar Kannan,
Friedrich Taenzler,
2011,
J. Electron. Test..
Abhijit Chatterjee,
Vishwanath Natarajan,
Shreyas Sen,
2010,
IEEE Design & Test of Computers.
Abhijit Chatterjee,
Friedrich Taenzler,
Ganesh Srinivasan,
2008,
IEEE Design & Test of Computers.
Sule Ozev,
Friedrich Taenzler,
Jae Woong Jeong,
2014,
2014 IEEE 32nd VLSI Test Symposium (VTS).
Sule Ozev,
Erkan Acar,
Friedrich Taenzler,
2008,
2008 IEEE International Test Conference.
Bruce C. Kim,
Sukeshwar Kannan,
Friedrich Taenzler,
2010,
2010 IEEE International Test Conference.
Friedrich Taenzler,
Ganesh Srinivasan,
Hui-Chuan Chao,
2008,
2008 IEEE International Test Conference.
Friedrich Taenzler,
Saikat Mondal,
Bruce Kim,
2014,
2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS).
Friedrich Taenzler,
Erich Kubalek,
Thomas Novak,
1993,
Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.
Abhijit Chatterjee,
Friedrich Taenzler,
2010,
VTS.
Anurag Gupta,
Bruce C. Kim,
Sukeshwar Kannan,
2013,
2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems.
Abhijit Chatterjee,
Vishwanath Natarajan,
Shreyas Sen,
2012,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Friedrich Taenzler,
Bruce Kim,
Sukeshwar Kannan,
2012,
2012 IEEE 14th Electronics Packaging Technology Conference (EPTC).
Sukeshwar Kannan,
Friedrich Taenzler,
Ken Moushegian,
2012
.