Sri Jandhyala

Expediting ramp-to-volume production

Kenneth M. Butler, Jason Parker, Hari Balachandran, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Clustering based evaluation of I/sub DDQ/ measurements: applications in testing and classification of ICs

Anura P. Jayasumana, Manidip Sengupta, Hari Balachandran, 2000, Proceedings 18th IEEE VLSI Test Symposium.

Clustering based techniques for I/sub DDQ/ testing

Anura P. Jayasumana, Hari Balachandran, Sri Jandhyala, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Antirandom Testing: A Distance-Based Approach

Anura P. Jayasumana, Yashwant K. Malaiya, Shen Hui Wu, 2008, VLSI Design.