I. Kurachi

Improvement of oxide reliability in NAND flash memories using tight endurance cycling with shorter idling period

Riichiro Shirota, Yu-Ting Wu, M. Aoki, 2015, 2015 IEEE International Reliability Physics Symposium.

New Mechanism of LER Formation in Gate Process

I. Kurachi, A. Yabata, O. Koike, 2006, 2006 IEEE International Symposium on Semiconductor Manufacturing.