Halil Kukner

发表

Incorporating parameter variations in BTI impact on nano-scale logical gates analysis

Francky Catthoor, Said Hamdioui, Praveen Raghavan, 2012, 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model

Rudy Lauwereins, Liesbet Van der Perre, Francky Catthoor, 2012, DSD.

NBTI Aging on 32-Bit Adders in the Downscaling Planar FET Technology Nodes

Rudy Lauwereins, Liesbet Van der Perre, Francky Catthoor, 2014, 2014 17th Euromicro Conference on Digital System Design.

Generic, orthogonal and low-cost March Element based memory BIST

Said Hamdioui, Ad J. van de Goor, Halil Kukner, 2011, 2011 IEEE International Test Conference.

The defect-centric perspective of device and circuit reliability — From individual defects to circuits

Francky Catthoor, Dimitri Linten, Philippe Roussel, 2015, 2015 45th European Solid State Device Research Conference (ESSDERC).

Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes

Liesbet Van der Perre, Francky Catthoor, Guido Groeseneken, 2015, Microprocess. Microsystems.

A high performance reconfigurable Motion Estimation hardware architecture

Ilker Hamzaoglu, Ozgur Tasdizen, Abdulkadir Akin, 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

Bias temperature instability analysis in SRAM decoder

Francky Catthoor, Said Hamdioui, Praveen Raghavan, 2013, 2013 18th IEEE European Test Symposium (ETS).

BTI impact on logical gates in nano-scale CMOS technology

Francky Catthoor, Said Hamdioui, Praveen Raghavan, 2012, 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).

Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model

Rudy Lauwereins, Liesbet Van der Perre, Francky Catthoor, 2012, 2012 15th Euromicro Conference on Digital System Design.

Modelling and mitigation of time-zero variability in sub-16nm finfet-based STT-MRAM memories

Liesbet Van der Perre, Wim Dehaene, Praveen Raghavan, 2014, GLSVLSI '14.

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2013, 2013 8th IEEE Design and Test Symposium.

Scaling of BTI reliability in presence of time-zero variability

Francky Catthoor, Guido Groeseneken, Jacopo Franco, 2014, 2014 IEEE International Reliability Physics Symposium.

Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation

Ilker Hamzaoglu, Ozgur Tasdizen, Abdulkadir Akin, 2009, IEEE Transactions on Consumer Electronics.

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

Francky Catthoor, Guido Groeseneken, Said Hamdioui, 2014, IEEE Transactions on Device and Materials Reliability.

The impact of process variation and stochastic aging in nanoscale VLSI

Francky Catthoor, Guido Groeseneken, Saman Kiamehr, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

2015 JETTA Reviewers

Robert Wille, Yong-Bin Kim, Alexandre M. Amory, 2016, Journal of electronic testing.

Degradation analysis of datapath logic subblocks under NBTI aging in FinFET technology

Liesbet Van der Perre, Guido Groeseneken, Ben Kaczer, 2014, Fifteenth International Symposium on Quality Electronic Design.

Bias Temperature Instability analysis of FinFET based SRAM cells

Francky Catthoor, Said Hamdioui, Ben Kaczer, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2015, 2015 IEEE 33rd VLSI Test Symposium (VTS).