Y. Kato
发表
S. Sawadaishi,
Y. Kato,
N. Ohyu,
1990
.
Y. Kato,
H. Masuda,
M. Fujimoto,
1999,
1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).
K. Sawada,
Y. Kato,
H. Takao,
2004,
IEEE Transactions on Electron Devices.