Nikolai S. Trushkin

Features of the model of main information failures in digital CMOS VLSI at impact of the radiation

Vyacheslav M. Barbashov, Nikolai S. Trushkin, 2018 .

Using probabilistic fuzzy models for the prediction of functional failures of microwave LSI with radiation exposure

V. M. Barbashov, Nikolai S. Trushkin, Aleksei Osipov, 2019 .