K. Uchida

Silicon single-electron memory and logic devices for room temperature operation

A. Toriumi, J. Koga, R. Ohba, 2001, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224).

Stress Engineering for High-k FETs: Mobility and Ion Enhancements by Optimized Stress

K. Uchida, S. Kobayashi, M. Saitoh, 2007, 2007 IEEE Symposium on VLSI Technology.

Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications

K. Uchida, S. Fujita, T. Tanamoto, 2002, Digest. International Electron Devices Meeting,.

Floating Gate super multi level NAND Flash Memory Technology for 30nm and beyond

K. Uchida, S. Watanabe, S. Sato, 2008, 2008 IEEE International Electron Devices Meeting.

Programmable single-electron transistor logic for low-power intelligent Si LSI

A. Toriumi, J. Koga, R. Ohba, 2002, 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315).

Single-Electron Transistors and Circuits for Future Ubiquitous Computing Applications

K. Uchida, 2006, 2006 European Solid-State Device Research Conference.

Remote experiment of ultrashort-pulse reflectometry for large helical device plasmas

K. Uchida, Tokihiko Tokuzawa, Atsushi Mase, 2006 .

Physical random number generator based on MOS structure after soft breakdown

R. Ohba, K. Uchida, S. Fujita, 2004, IEEE Journal of Solid-State Circuits.

Device design for subthreshold slope and threshold voltage control in sub-100 nm fully-depleted SOI MOSFETs

S. Takagi, J. Koga, K. Uchida, 2002, 2002 IEEE International SOI Conference.