Konstantin O. Petrosyants

发表

Digital circuit IBIS-models generation with account for temperature and radiation

Konstantin O. Petrosyants, Igor A. Kharitonov, A. S. Adonin, 2012 .

Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI’s Using Universal Rad-SPICE MOSFET Model

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2017, J. Electron. Test..

Complex for automated measurement and processing of BJTs and MOSFETs characteristics for extremal applications

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2016, 2016 International Siberian Conference on Control and Communications (SIBCON).

IV-Characteristics Measurement Error Resulting from Long Cables for Irradiated Bipolar Junction Transistors

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2015 .

Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2013, East-West Design & Test Symposium (EWDTS 2013).

TCAD analysis of self-heating effects in bulk silicon and SOI n-MOSFETs

Konstantin O. Petrosyants, Igor A. Kharitonov, Evgeny Orekhov, 2013, Other Conferences.

Thermal analysis of the ball grid array packages

Konstantin O. Petrosyants, Nikita I. Rjabov, 2011, 2011 9th East-West Design & Test Symposium (EWDTS).

SPICE model parameters extraction taking into account the ionizing radiation effects

Konstantin O. Petrosyants, Maxim Kozhukhov, 2014, Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014).

Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2017, 2017 IEEE East-West Design & Test Symposium (EWDTS).

Analysis and Simulation of temperature-current rise in modern PCB traces

Konstantin O. Petrosyants, Igor A. Kharitonov, Anton Popov, 2014, Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014).

Electro-thermal simulation process implementation in Mentor Graphics IC Station

Konstantin O. Petrosyants, Igor A. Kharitonov, P. A. Kozynko, 2008 .

Electro-Thermal Design of Smart Power Devices and Integrated Circuits

Konstantin O. Petrosyants, Igor A. Kharitonov, Nikita I. Ryabov, 2014 .

TCAD-SPICE simulation of MOSFET switch delay time for different CMOS technologies

D. A. Popov, Konstantin O. Petrosyants, Igor A. Kharitonov, 2011, 2011 9th East-West Design & Test Symposium (EWDTS).

Logi-thermal analysis of digital circuits using mixed-signal simulator Questa ADMS

Konstantin O. Petrosyants, Nikita I. Rjabov, 2013, East-West Design & Test Symposium (EWDTS 2013).

Development of compact SPICE-models of IC resistive interconnects with different configurations

Konstantin O. Petrosyants, Boris G. Lvov, Nikita I. Ryabov, 2018, 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT).

Hardware-software subsystem for multilevel thermal fault detection and analysis of electronic components

Konstantin O. Petrosyants, Igor A. Kharitonov, Boris G. Lvov, 2016, 2016 International Siberian Conference on Control and Communications (SIBCON).

Hardware-Software Subsystem for MOSFETs Characteristic Measurement and Parameter Extraction with Account for Radiation Effects

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2013 .

Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2016, 2016 17th Latin-American Test Symposium (LATS).

Modeling of the submicron MOSFETs characteristics for UTSi technology

Konstantin O. Petrosyants, Alexey Adonin, D. A. Popov, 2019, International Conference on Micro- and Nano-Electronics.

Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU

D. A. Popov, Konstantin O. Petrosyants, Igor A. Kharitonov, 2013, East-West Design & Test Symposium (EWDTS 2013).

Quasi-3D Thermal Model of Stacked IC-TSV-BGA Package

Konstantin O. Petrosyants, Nikita I. Ryabov, 2019, 2019 25th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).

Design and development of SOI CMOS OA

Konstantin O. Petrosyants, Igor A. Kharitonov, V. N. Bogatyrev, 2005 .

Si BJT and SiGe HBT performance modeling after neutron radiation exposure

Konstantin O. Petrosyants, Maxim Kozhukhov, Dmitry Smirnov, 2011, 2011 9th East-West Design & Test Symposium (EWDTS).

Account for Radiation Effects in Signal Integrity Analysis of PCB Digital Systems

Konstantin O. Petrosyants, Igor A. Kharitonov, 2013, 2013 Euromicro Conference on Digital System Design.

SOI/SOS MOSFET universal compact SPICE model with account for radiation effects

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2015, EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon.

Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C)

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2017, Microelectron. Reliab..

Quasi-3D Thermal Simulation of Integrated Circuit Systems in Packages

Konstantin O. Petrosyants, Nikita I. Ryabov, N. I. Ryabov, 2020, Energies.

Temperature characterization of small-scale SOI MOSFETs in the extended range (to 300°C)

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, 2016, 2016 22nd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC).

Physical TCAD Model for Proton Radiation Effects in SiGe HBTs

Konstantin O. Petrosyants, Maxim V. Kozhukhov, K. Petrosyants, 2016, IEEE Transactions on Nuclear Science.