Michael W. Tian

Non-Monte Carlo Simulation and Sensitivity of Linear(ized) Analog Circuits under Parameter Variations*

C.-J. Richard Shi, Michael W. Tian, C. Shi, 1997 .

Rapid frequency-domain analog fault simulation under parameter tolerances

C.-J. Richard Shi, Michael W. Tian, 1997, DAC.

Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis

C.-J. Richard Shi, Michael W. Tian, C. Shi, 1999, TODE.

Nonlinear analog DC fault simulation by one-step relaxation

C.-J. Richard Shi, Michael W. Tian, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).

Automatic test generation of linear analog circuits under parameter variations

C.-J. Richard Shi, Michael W. Tian, C. Shi, 1998, Proceedings of 1998 Asia and South Pacific Design Automation Conference.