Francesco Di Capua

A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

Marco Ottavi, Gianluca Furano, Tomasz Szewczyk, 2016, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Qualitative techniques for System-on-Chip test with low-energy protons

Marco Ottavi, Gianluca Furano, Tomasz Szewczyk, 2016, 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS).

Towards defining a simplified procedure for COTS system-on-chip TID testing

Marco Ottavi, A. Menicucci, Andrea Lucaroni, 2018 .

Open-Hardware and Application Specific Design for the Monitoring System of the Belle II Forward/Backward Electromagnetic Calorimeter

G. Tortone, Paolo Branchini, Alberto Aloisio, 2019, EPJ Web of Conferences.