M. McManus

Non-invasive timing analysis of IBM G6 microprocessor L1 cache using backside time-resolved hot electron luminescence

W. Huott, S. Polonsky, D. Knebel, 2000, 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056).

Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs

M. Muhammad, R. Gauthier, K. Chatty, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.