Y. Miyashita

Human sensitivity of color defects inspection

S. Hata, Y. Miyashita, H. Hanafusa, 1996, Proceedings of the 1996 IEEE IECON. 22nd International Conference on Industrial Electronics, Control, and Instrumentation.

Application of Eigenspace Beamformer to Virtual Depth-Electrode Measurement Using MEG

Y. Miyashita, K. Sekihara, D. Peoppel, 1999 .