Manabendra Maji

Parallelized automatic false defect detection using GPUs during mask inspection

Ravi R. Pai, Mark Pereira, Anil Parchuri, 2011, Photomask Technology.

Key issues in automatic classification of defects in post-inspection review process of photomasks

Ravi R. Pai, Mark Pereira, Manabendra Maji, 2012, Photomask Technology.