S. L. Tan

Development of a metrological atomic force microscope for nano-scale standards calibration

S. H. Wang, G. Xu, S. L. Tan, 2008, International Symposium on Laser Metrology.

Study of an AFM probe having a cantilever with a longer diamond tip for metrological application

S. L. Tan, S. H. Wang, G. Xu, 2010, International Conference on Experimental Mechanics.

Evaluation on the probing error of a micro-coordinate measuring machine

S. L. Tan, Z. X. Chao, G. Xu, 2008, International Symposium on Laser Metrology.