Maria Glória Caño de Andrade

Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation

Cor Claeys, Eddy Simoen, Marc Aoulaiche, 2014, Microelectron. Reliab..

On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs

Anabela Veloso, Marc Aoulaiche, Cor Claeys, 2012, 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

Threshold voltages of SOI MuGFETs

Joao Antonio Martino, Maria Glória Caño de Andrade, J. Martino, 2008 .

RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application

Geert Van den bosch, Cor Claeys, Eddy Simoen, 2013 .