Yueh-Hua Wang

Scalable Short-Open-Interconnect S-Parameter De-Embedding Method for On-Wafer Microwave Characterization of Silicon MOSFETs

Lin-Kun Wu, Ming-Hsiang Cho, Yueh-Hua Wang, 2007, IEICE Trans. Electron..

A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs

Lin-Kun Wu, Ming-Hsiang Cho, Yueh-Hua Wang, 2009, IEICE Trans. Electron..

A scalable noise de-embedding technique for on-wafer microwave device characterization

Guo-Wei Huang, Lin-Kun Wu, Ming-Hsiang Cho, 2005 .

A Shield-Based Three-Port De-Embedding Method for Microwave On-Wafer Characterization of

Guo-Wei Huang, Tsun-Lai Hsu, Kun-Ming Chen, 2005 .

Through-Silicon-Via Characterization and Modeling Using a Novel One-Port De-Embedding Technique

David Chen, Lin-Kun Wu, An-Sam Peng, 2013, IEICE Trans. Electron..

Comments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs"

Guo-Wei Huang, Tsun-Lai Hsu, Hua-Chou Tseng, 2005 .