Guilherme Cardoso Medeiros

NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits’ Life Time

Fabian Vargas, Thiago Copetti, Guilherme Cardoso Medeiros, 2016, J. Electron. Test..

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Analyzing the behavior of FinFET SRAMs with resistive defects

Tiago R. Balen, Letícia Maria Veiras Bolzani, Thiago Copetti, 2017, 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC).

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs

Tiago R. Balen, Letícia Maria Veiras Bolzani, Thiago Copetti, 2017, VLSI-SoC.

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits

Fabian Vargas, Giovanni Squillero, Raimund Ubar, 2016, J. Electron. Test..

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, 2019, 2019 IEEE European Test Symposium (ETS).

A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects

Fabian Vargas, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, 2018, 2018 IEEE 19th Latin-American Test Symposium (LATS).

Device-Aware Test: A New Test Approach Towards DPPB Level

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2019, 2019 IEEE International Test Conference (ITC).

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2019, 2019 IEEE European Test Symposium (ETS).

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

Said Hamdioui, Mottaqiallah Taouil, Thiago Copetti, 2020, 2020 IEEE Latin-American Test Symposium (LATS).

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects

Tiago R. Balen, Said Hamdioui, Mottaqiallah Taouil, 2021, J. Electron. Test..

Modeling Soft-Error Reliability Under Variability

Dan Alexandrescu, Said Hamdioui, Guilherme Cardoso Medeiros, 2021, 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Intermittent Undefined State Fault in RRAMs

Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil, 2021, 2021 IEEE European Test Symposium (ETS).