Hisham Z. Massoud

发表

An evaluation of the impact of gate oxide tunneling on dual-Vt-based leakage reduction techniques

Krishnendu Chakrabarty, Lara D. Oliver, Hisham Z. Massoud, 2006, GLSVLSI '06.

Microelectromechanical systems: a new technology for biomedical applications

Richard B. Fair, Hisham Z. Massoud, M. Mehregany, 1993, Proceedings of the 15th Annual International Conference of the IEEE Engineering in Medicine and Biology Societ.

Solution of the 3-D Schr&diaero;dinger equation with tensor effective mass based on perfectly matched layer and spectral element methods

Hisham Z. Massoud, Qing Huo Liu, Kim Hwa Lim, 2007, SPIE OPTO.

Dual-threshold pass-transistor logic design

Krishnendu Chakrabarty, Lara D. Oliver, Hisham Z. Massoud, 2009, GLSVLSI '09.

The spectral grid method: a novel fast Schrodinger-equation solver for semiconductor nanodevice simulation

Qing Huo Liu, Hisham Z. Massoud, Candong Cheng, 2004, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Integrated Sensing and Information Processing Theme-Based Redesign of the Undergraduate Electrical and Computer Engineering Curriculum at Duke University.

Leslie M. Collins, Romit Roy Choudhury, Steven A. Cummer, 2011 .

Integrating Sensing and Information Processing in an Electrical and Computer Engineering undergraduate curriculum

Leslie M. Collins, Hisham Z. Massoud, Gary A. Ybarra, 2009, 2009 39th IEEE Frontiers in Education Conference.

Theme Based Redesign Of The Duke University Ece Curriculum: The First Steps

Leslie M. Collins, Hisham Z. Massoud, John A. Board, 2005 .

Design Of A Flexible Rf/Ir Data Link And Associated Laboratory Curriculum In A First Analog Electronics And Devices Course

Hisham Z. Massoud, Kip Coonley, Martin A. Brooke, 2009 .

Two-dimensional impurity profiling with emission computed tomography techniques

Carey E. Floyd, Hisham Z. Massoud, Scott H. Goodwin-Johansson, 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

3D quantum transport solver based on the perfectly matched layer and spectral element methods for the simulation of semiconductor nanodevices

Qing Huo Liu, Hisham Z. Massoud, Candong Cheng, 2007, J. Comput. Phys..

Redesign Of The Core Curriculum At Duke University

Leslie M. Collins, Hisham Z. Massoud, John A. Board, 2006 .

ULSI science and technology, 1995 : proceedings of the Fifth International Symposium on Ultra Large Scale Integration Science and Technology

Hisham Z. Massoud, Ed Middlesworth, 1995 .

Measurement and modeling of charge feedthrough in n-channel MOS analog switches

Hisham Z. Massoud, W. B. Wilson, Richard B. Fair, 1985 .

ON-state reliability of amorphous-silicon antifuses

Hisham Z. Massoud, Michael J. Hart, Richard B. Fair, 1998 .

Energy considerations during the growth of a molten filament in metal-to-metal amorphous-silicon antifuses

Hisham Z. Massoud, Richard B. Fair, N. Vasudevan, 1998 .

The Effect of Annealing Ambient on Dopant Diffusion in Silicon during Low‐Temperature Processing

Hisham Z. Massoud, Richard B. Fair, Yudong Kim, 1990 .

Experimental characterization of two‐dimensional dopant profiles in silicon using chemical staining

Hisham Z. Massoud, Richard B. Fair, Ravi Subrahmanyan, 1988 .

Thermal oxidation of silicon in dry oxygen growth-rate enhancement in the thin regime. I: Experimental results

James D. Plummer, Hisham Z. Massoud, Eugene A. Irene, 1985 .

The effect of ion-implantation damage on dopant diffusion in silicon during shallow-junction formation

Hisham Z. Massoud, Richard B. Fair, H. Z. Massoud, 1989 .

Comparison of Measured and Simulated Two‐Dimensional Phosphorus Diffusion Profiles in Silicon

Hisham Z. Massoud, Richard B. Fair, Ravi Subrahmanyan, 1990 .

Thermal Oxidation of Silicon in Dry Oxygen: Growth‐Rate Enhancement in the Thin Regime II . Physical Mechanisms

James D. Plummer, Hisham Z. Massoud, Eugene A. Irene, 1985 .

Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5

Hisham Z. Massoud, 2005 .

Manufacturability of rapid-thermal oxidation of silicon: oxide thickness, oxide thickness variation, and system dependency

Hisham Z. Massoud, H. Massoud, R. Deaton, 1992 .

Electron trapping in SiO2 at 295 and 77 °K

Hisham Z. Massoud, Eugene A. Irene, D. R. Young, 1979 .

Thermal oxidation of silicon in dry oxygen

James D. Plummer, Hisham Z. Massoud, Eugene A. Irene, 1983 .

Analytical relationship for the oxidation of silicon in dry oxygen in the thin‐film regime

James D. Plummer, Hisham Z. Massoud, H. Z. Massoud, 1987 .

The role of substrate carrier generation in determining the electric field in the oxide of MOS capacitors biased in the Fowler-Norheim tunneling regime

James P. Shiely, Hisham Z. Massoud, 1997 .