Woon-Il Choi

Decoupling of RTS noise in high density CMOS image sensor using new test structures

Hi-Deok Lee, Sang-Uk Park, Ju-Il Lee, 2011, 2011 IEEE ICMTS International Conference on Microelectronic Test Structures.

A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor

Byoung Hun Lee, Sung-Kyu Kwon, Sun-Ho Oh, 2014, IEEE Transactions on Electron Devices.

Effect of Nitrogen Concentration on Low-Frequency Noise and Negative Bias Temperature Instability of p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Nitrided Gate Oxide

Sung-Kyu Kwon, Ga-Won Lee, Min-Gyu Lim, 2011 .