Liewei Xu

Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits

Jian Yu, Tianqi Liu, Chang Cai, 2020, IEEE Access.

SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA

Yu Jian, Guangwen Yang, Tianqi Liu, 2019, Electronics.

Design and verification of universal evaluation system for single event effect sensitivity measurement in very-large-scale integrated circuits

Chang Wu, Jun Yu, Tianqi Liu, 2019, IEICE Electron. Express.

The total ionizing dose response of leading-edge FDSOI MOSFETs

Jian Wang, Kai Zhao, Fang Yu, 2018, Microelectronics and reliability.