Angela Duparre

发表

X-ray and AFM studies of ultrathin films for EUV and soft x-ray applications

Victor E. Asadchikov, Igor V. Kozhevnikov, Angela Duparre, 1999, Optical Systems Design.

Analysis of interface and volume inhomogeneities in a multilayer system by light scattering methods

Uwe Schuhmann, Angela Duparre, Stephan Pichlmaier, 1996, Optical Systems Design.

Roughness and scattering measurements on thin films for UV/VIS applications

Uwe Schuhmann, Angela Duparre, Axel Kiesel, 1994, Optics & Photonics.

Characterization procedures for nanorough ultrahydrophobic surfaces with controlled optical matter

Angela Duparre, Marcel Flemming, Karsten Reihs, 2003, SPIE Optics + Photonics.

Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods

Victor E. Asadchikov, Igor V. Kozhevnikov, Angela Duparre, 1999, Optical Systems Design.

Microtopography investigations of optical surfaces and thin films by light scattering, optical profilometry, and atomic-force microscopy

Horst Truckenbrodt, Angela Duparre, Norbert Kaiser, 1993, Optics & Photonics.

Modification Of The Statistical Microroughness Of Surfaces By Thin Film Deposition: A Model

Angela Duparre, Heinz-Gunter Walther, 1989, Other Conferences.

X-ray study of surfaces and interfaces

Christian Morawe, Victor E. Asadchikov, Alexander V. Vinogradov, 2001, SPIE Optics + Photonics.

Roughness and defect characterization of optical surfaces by light-scattering measurements

Horst Truckenbrodt, Uwe Schuhmann, Angela Duparre, 1993, Optical Systems Design.

Dependence of the surface morphology and scattering of optical coatings on film material, substrate roughness, and deposition process

Torsten Feigl, Angela Duparre, Stephan Pichlmaier, 1996, Optical Systems Design.

Surface texture investigation of ultra-precision optical components

Angela Duparre, Stefan Gliech, Sven Schroeder, 2005, SPIE Optics + Photonics.

Properties of fluoride DUV excimer laser optics: influence of the number of dielectric layers

Norbert Kaiser, Helmut Bernitzki, Roland Thielsch, 2000, Laser Damage.

DUV light scattering and morphology of ion beam sputtered fluoride coatings

Etienne Quesnel, Angela Duparre, Joerg Steinert, 1999, Optical Systems Design.

Surface finish and optical quality of CaF2 for UV lithography applications

Norbert Kaiser, Roland Thielsch, Klaus R. Mann, 1998, Advanced Lithography.

X-ray investigations of a near surface layer of metal samples

Sergey P. Kuznetsov, Victor E. Asadchikov, Igor V. Kozhevnikov, 2000, SPIE Optics + Photonics.

Microroughness analysis of thin film components for VUV applications

Etienne Quesnel, Detlev Ristau, Angela Duparre, 2000, SPIE Optics + Photonics.

VUV light scattering measurements of substrtes and thin film coatings

Angela Duparre, Stefan Gliech, Annette Hultaker, 2003, SPIE Optics + Photonics.

Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter

Angela Duparre, Marcel Flemming, Karsten Reihs, 2004, SPIE Optical Systems Design.

Real-time defect detection using multiaperture fiber optic sensors and machine learning

Hendrik Rothe, Angela Duparre, Peter Riedel, 1993, Other Conferences.

Results of a round-robin experiment on reflectivity measurements at a wavelength of 1.06 μm

Wolfgang Riede, Kai Starke, Rimantas Grigonis, 2003, SPIE Laser Damage.

Characterization of CaF2 substrates for VUV fluoride coatings

Angela Duparre, Stefan Gliech, Annette Hultaker, 2004, SPIE Optical Systems Design.

Wide-scale surface measurement using white light interferometry and atomic force microscopy

Gunther Notni, Torsten Feigl, Angela Duparre, 1998, Optics & Photonics.

System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nm

Angela Duparre, Stefan Gliech, Henning Gessner, 2003, SPIE Laser Damage.

X-ray study of the roughness of surfaces and interfaces

Christian Morawe, Victor E. Asadchikov, Igor V. Kozhevnikov, 2000, SPIE Optics + Photonics.

Quality assessment of supersmooth to rough surfaces by multiple-wavelength light scattering measurement

Angela Duparre, Stefan Gliech, 1997, Optics & Photonics.

Multitype surface and thin film characterization using light scattering, scanning force microscopy, and white light interferometry

Gunther Notni, Angela Duparre, A. Duparré, 1999, Optics + Photonics.

ArF radiation resistance of optical coatings on CaF2 in relation to the surface finish of the substrate

Norbert Kaiser, Roland Thielsch, Joerg Heber, 1999, Laser Damage.

Light scattering and atomic force microscopic investigations on magnetron sputtered oxide single layers and multilayers for micromechanical laser mirrors

Angela Duparre, Stefan Gliech, Frank Richter, 1999, Optical Systems Design.

Wide-scale surface characterization by combination of scanning force microscopy, white light interferometry, and light scattering

Angela Duparre, Stefan Gliech, Gunther Notni, 1999, Optical Systems Design.

DUV/VUV light scattering measurement of optical components for lithography applications

Angela Duparre, Stefan Gliech, Marcel Flemming, 2000, SPIE Optics + Photonics.

Morphology investigations by atomic force microscopy of thin films and substrates for excimer laser mirrors

Norbert Kaiser, Angela Duparre, Stefan Jakobs, 1994, Laser Damage.

UV-optical and microstructural properties of MgF2-coatings deposited by IBS and PVD processes

Salvador Bosch, Etienne Quesnel, Detlev Ristau, 1999, Optical Systems Design.

Properties of SiO2 and Al2O3 films for use in UV optical coatings

Roland Thielsch, Angela Duparre, Norbert Kaiser, 1997, Optics & Photonics.

Advanced methods for surface and subsurface defect characterization of optical components

Angela Duparre, Stefan Gliech, Horst Truckenbrodt, 2000, SPIE Optics + Photonics.

Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths

Angela Duparre, Stefan Gliech, 1996, Optical Systems Design.

Determination of thin-film roughness and volume structure parameters from light-scattering investigations

Angela Duparre, Samer Kassam, 1991, Optics & Photonics.

Principal surface approach as means of precise RMS-roughness estimation in noncontact profilometry

Hendrik Rothe, Angela Duparre, Andre Kasper, 1994, Optics & Photonics.

Surface-finish assessment of synthetic quartz glass

Angela Duparre, Axel Kiesel, Horst Truckenbrodt, 1996, Optical Systems Design.

Scatter analysis of optical components from 193 nm to 13.5 nm

Angela Duparre, Stefan Gliech, Sven Schroeder, 2005, SPIE Optics + Photonics.

Real-time detection of surface damage by direct assessment of the BRDF

Horst Truckenbrodt, Hendrik Rothe, Angela Duparre, 1993, Optics & Photonics.

International round-robin experiment on optical total scattering at 633 nm according to ISO/DIS 13696

Claude Amra, Uwe Schuhmann, Detlev Ristau, 1999, Optical Systems Design.

Surface roughness and subsurface damage characterization of fused silica substrates

Angela Duparre, Horst Truckenbrodt, Joerg Steinert, 1999, Optical Systems Design.

Laterally and depth resolved photothermal absorption measurements on ZrO2 and MgF2 single-layer films

Eberhard Welsch, Angela Duparre, Michael Reichling, 1993, Optical Systems Design.

Optical characterization of materials desposited by different processes: the LaF3 in the UV-visible region

Etienne Quesnel, Detlev Ristau, Angela Duparre, 2000, SPIE Optics + Photonics.

Influence of substrate surface and film roughness on the quality of optical coatings for the UV spectral region

Angela Duparre, Norbert Kaiser, Stefan Jakobs, 1997, Other Conferences.

157- and 193-nm scatter, R, and T measurement technique

Angela Duparre, Stefan Gliech, Annette Hultaker, 2004, SPIE Optical Systems Design.

SLIOS: a contribution to standard procedures in stray light measurements

Kees Smorenburg, Stefan M. B. Baumer, Angela Duparre, 1999, Optical Systems Design.

New procedure for the optical characterization of high-quality thin films

Etienne Quesnel, Detlev Ristau, Angela Duparre, 2000, SPIE Optics + Photonics.

Scattering losses of oxide and fluoride coatings for lasers

Hein Uhlig, Angela Duparre, Samer Kassam, 1993, Optical Systems Design.

Characterizing CaF2 for VUV optical components: roughness, surface scatter, and bulk scatter

Angela Duparre, Stefan Gliech, Annette Hultaker, 2003, SPIE Laser Damage.

Laser damage threshold of MgF2 thin films by photoacoustic beam deflection

Etienne Quesnel, Detlev Ristau, Angela Duparre, 2000, Laser Damage.

IAD of oxide coatings at low temperature: a comparison of processes based on different ion sources

Detlev Ristau, Angela Duparre, Norbert Kaiser, 1997, Optics & Photonics.

Interface and volume inhomegeneities in optical thin films investigated by light scattering methods

Uwe Schuhmann, Angela Duparre, Stephan Pichlmaier, 1994, Other Conferences.

Noncontact testing of optical surfaces by multiple-wavelength light scattering measurement

Angela Duparre, Stefan Gliech, 1997, Other Conferences.