Keon-Soo Kim

Output buffer circuit for a byte-wide memory

Hyung-Kyu Lim, Hyong-Gon Lee, Keon-Soo Kim, 1989 .

Direct Field Effect of Neighboring Cell Transistor on Cell-to-Cell Interference of nand Flash Cell Arrays

Keon-Soo Kim, Jong-Ho Park, Min-Cheol Park, 2009 .

Impact of floating gate dry etching on erase characteristics in NOR flash memory

Kang-Deog Suh, Yonghan Roh, W.H. Lee, 2002, IEEE Electron Device Letters.

Influence of plasma edge damage on erase characteristics of NOR flash EEPROM using channel erase method

Kang-Deog Suh, Yonghan Roh, Woung-Moo Lee, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).