Jarosław Serafińczuk

Application of FFT transformation for correlation analysis of near field microscopy measurements

Teodor Gotszalk, A. Sikora, R. Szeloch, 2009 .

Structural Characterization of Doped Thick Gainnas Layers - Ambiguities and Challenges

Jarosław Serafińczuk, Jaroslav Kováč, Wojciech Dawidowski, 2014 .

Characterizations of GaInNAs/GaAs quantum wells

Jarosław Serafińczuk, Marek Tłaczała, Wojciech Dawidowski, 2013, Electron Technology Conference.

Influence of the AP MOVPE process parameters on properties of (In, Ga)(As, N)/ GaAs heterostructures for photovoltaic applications

Jarosław Serafińczuk, Jaroslav Kováč, Marek Tłaczała, 2013, Electron Technology Conference.