Christian Rumbolz

Time-resolved scanning near-field microscopy of InGaN laser diode dynamics

Alfred Lell, Ulrich T. Schwarz, M. Furitsch, 2006, SPIE Photonics Europe.

Comparison of degradation mechanisms of blue‐violet laser diodes grown on SiC and GaN substrates

Alfred Lell, Uwe Strauß, M. Furitsch, 2006 .