Patrick Martin

Reliability analysis of low noise amplifiers for wireless applications under high RF power stressing

Philippe Descamps, Patrice Gamand, Dominique Lesenechal, 2017, 2017 International Conference on Advanced Technologies for Communications (ATC).

Scalable electromagnetic segmentation methodology for accurate investigation of inductive couplings

Philippe Descamps, Sidina Wane, Olivier Tesson, 2009, 2009 IEEE Radio Frequency Integrated Circuits Symposium.

Electrical Overstress robustness and test method for ICs

Jean-Luc Lefebvre, Pierre Guillot, Patrick Martin, 2014, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014.

Hot carrier injection and negative bias temperature instability induced NMOS and PMOS degradation on CMOS Ring Oscillator

Guy Imbert, Insaf Lahbib, Patrick Martin, 2016, 2016 Annual Reliability and Maintainability Symposium (RAMS).