N. P Garbar

发表

RTS noise due to lateral isolation related defects in submicron nMOSFETs

Cor Claeys, Eddy Simoen, N. Lukyanchikova, 1998 .

A study of noise in surface and buried channel SiGe MOSFETs with gate oxide grown by low temperature plasma anodization

Steve Hall, N. B. Lukyanchikova, N. P Garbar, 2002 .

Problems of low-frequency noise in depletion mode pMOSFETs under inversion conditions

Cor Claeys, Eddy Simoen, N. Lukyanchikova, 1996 .

Identification of isolation-edge related random telegraph signals in submicron silicon metal–oxide–semiconductor field-effect transistors

Cor Claeys, Eddy Simoen, N. Lukyanchikova, 1997 .

Back and front interface related generation-recombination noise in buried-channel SOI pMOSFETs

E. Simoen, C. Claeys, N. Lukyanchikova, 1996 .

Single Defect Studies by Means of Random Telegraph Signals in Submicron Silicon MOSFETs

Cor Claeys, Eddy Simoen, M. Petrichuk, 1999 .

Electron valence-band tunneling-induced Lorentzian noise in deep submicron silicon-on-insulator metal-oxide-semiconductor field-effect transistors

Eddy Simoen, C. Claeys, Abdelkarim Mercha, 2003 .

High-energy proton irradiation induced changes in the linear-kink noise overshoot of 0.10 μm partially depleted silicon-on-insulator metal-oxide-semiconductor field-effect transistors

Eddy Simoen, Abdelkarim Mercha, Joan Marc Rafí, 2004 .

Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs

Eddy Simoen, Joao Antonio Martino, N. Lukyanchikova, 2006 .

On the Origin of the 1/f 1.7 Noise in Deep Submicron Partially Depleted SOI Transistors

Eddy Simoen, Christina De Meyer, Abdelkarim Mercha, 2002 .

Influence of the substrate voltage on the random telegraph signal parameters in submicron n-channel metal-oxide-semiconductor field-effect transistors under a constant inversion charge density

Eddy Simoen, C. Claeys, N. P Garbar, 2000 .

The 1/f/sup 1.7/ noise in submicron SOI MOSFETs with 2.5 nm nitrided gate oxide

E. Simoen, C. Claeys, K. De Meyer, 2002 .

Non-trivial GR and 1/f noise generated in the p-Si layer of SOI and SOS MOSFETs near the inverted front or buried p-Si/SiO2 interface

Cor Claeys, Eddy Simoen, M. Petrichuk, 1999 .

Evidence for a linear kink effect in ultra-thin gate oxide SOI MOSFETs

E. Simoen, C. Claeys, Abdelkarim Mercha, 2003 .