Pamela S. Gillis

Delay test of chip I/Os using LSSD boundary scan

Ulrich Baur, Kevin McCauley, Pamela S. Gillis, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

Boundary-scan design principles for efficient LSSD ASIC testing

Douglas W. Stout, Steven F. Oakland, Mark Elliot Turner, 1990 .

Test methodologies and design automation for IBM ASICs

Brion L. Keller, Pamela S. Gillis, Tom S. Guzowski, 1996, IBM J. Res. Dev..

HIGH-DENSITY CMOS MULTICHIP-MODULE TESTING AND DIAGNOSIS

Pamela S. Gillis, Robert W. Bassett, John J. Shushereba, 1991, 1991, Proceedings. International Test Conference.

A 300 K-circuit ASIC logic family CAD system

David J. Hathaway, Keith M. Carrig, J. H. Panner, 1990, IEEE Proceedings of the Custom Integrated Circuits Conference.

A comprehensive CAD system for high-performance 300 K-circuit ASIC logic chips

David J. Hathaway, Keith M. Carrig, J. H. Panner, 1991 .

Low overhead delay testing of ASICs

K. McCauley, F. Woytowich, Pamela S. Gillis, 2004 .

Low overhead delay testing of ASICs

Andrew Ferko, Kevin McCauley, Pamela S. Gillis, 2004, 2004 International Conferce on Test.

Low-Cost Testing of High-Density Logic Components

Marc R. Faucher, Donald L. Wheater, John G. Petrovick, 1990, IEEE Des. Test Comput..