P. J. Tobin

Mobility and reliability improvements of fluorinated gate oxide for VLSI technology

Hsing-Huang Tseng, A. Balasinski, T. P. Ma, 1995, 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers.

Special Reliability Features for Hf-Based High- Gate Dielectrics

Tso-Ping Ma, Miaomiao Wang, P. J. Tobin, 2005 .

Temperature dependence of the anomalous leakage current in polysilicon-on-insulator MOSFET's

P. J. Tobin, Sanjay K. Banerjee, S. Banerjee, 1994 .