C. Goupil

Magnetic emission mapping for passive integrated components characterisation

Romain Desplats, Philippe Descamps, Philippe Perdu, 2003, Microelectron. Reliab..

Backside Hot Spot Detection Using Liquid Crystal Microscopy

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Magnetic field measurements for Non Destructive Failure Analysis

Philippe Descamps, Philippe Perdu, Bernadette Domengès, 2002, Microelectron. Reliab..