F. Chayab

发表

Part II. Dynamic single event upset characterization of the Virtex-II field programmable gate array using proton irradiation

D.M. Hiemstra, F. Chayab, 2005, IEEE Radiation Effects Data Workshop, 2005..

Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation

D.M. Hiemstra, F. Chayab, L. Szajek, 2004, 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774).

Dynamic single event upset characterization of the Virtex-IIPro's embedded IBM PowerPC405 using proton irradiation

D.M. Hiemstra, F. Chayab, R. Ronge, 2005, IEEE Radiation Effects Data Workshop, 2005..

Single Event Upset Characterization of the Virtex-4 Field Programmable Gate Array Using Proton Irradiation

F. Chayab, D.M. Hiemstra, Z. Mohammed, 2006, 2006 IEEE Radiation Effects Data Workshop.