M. Shoga

A systems-oriented single event effects test approach for high speed digital phase-locked loops

R. Koga, K. Jobe, M. Shoga, 1996 .

Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model

Stephen A. Wender, J. L. Wert, A. Gavron, 1995, Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95).

Ion-microbeam probe of high-speed shift registers for SEE Analysis-part I: SiGe

P. Chu, D.L. Hansen, M. Shoga, 2006, IEEE Transactions on Nuclear Science.

Radiation hardness evaluation of a class V 32-bit floating-point digital signal processor

M. Shoga, R. Joshi, R. Daniels, 2005, IEEE Radiation Effects Data Workshop, 2005..

Ion-microbeam probe of high-speed shift registers for SEU Analysis-part II: InP

P. Chu, D.L. Hansen, M. Shoga, 2006, IEEE Transactions on Nuclear Science.

Theory of Single Event Latchup in Complementary Metal-Oxide Semiconductor Integrated Circuits

M. Shoga, D. Binder, 1986, IEEE Transactions on Nuclear Science.

Correlation of Prediction to On-Orbit SEU Performance for a Commercial 0.25-$\mu$m CMOS SRAM

D.L. Hansen, M. Shoga, J. Whittington, 2007, IEEE Transactions on Nuclear Science.

Single event upset at gigahertz frequencies

R. Koga, M. Shoga, E. C. Smith, 1994 .

Verification of Single Event Upset Rate Estimation Methods with On-Orbit Observations

R. Koga, D. L. Chenette, M. Shoga, 1987, IEEE Transactions on Nuclear Science.

Ion-induced sustained high current condition in a bipolar device

R. Koga, D. J. Mabry, M. Shoga, 1994 .

Double upsets from glancing collisions: a simple model verified with flight data (SRAM)

M. Shoga, E. C. Smith, 1992 .