Dennis L. Oberg

Measurement of single event effects in the 87C51 microcontroller

Eugene Normand, Dennis L. Oberg, Jerry L. Wert, 1993, 1993 IEEE Radiation Effects Data Workshop.

First Nondestructive Measurements of Power MOSFET Single Event Burnout Cross Sections

Dennis L. Oberg, Jerry L. Wert, D. Oberg, 1987, IEEE Transactions on Nuclear Science.

Measurement of SEU Thresholds and Cross Sections at Fixed Incidence Angles

W. E. Wilson, Dennis L. Oberg, Jerry L. Wert, 1987, IEEE Transactions on Nuclear Science.