Kalyana R. Kantipudi

On the size and generation of minimal N-detection tests

Kalyana R. Kantipudi, 2006, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06).

A Reduced Complexity Algorithm for Minimizing N-Detect Tests

Vishwani D. Agrawal, Kalyana R. Kantipudi, V. Agrawal, 2007, 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07).

Controllability and Observability

Kalyana R. Kantipudi, 2005 .

Minimizing N -detect Tests for Combinational Circuits Minimizing N -detect Tests for Combinational Circuits Minimizing N -detect Tests for Combinational Circuits

Kalyana R. Kantipudi, V. Agrawal, C. Stroud, 2006 .

Minimizing N-Detect Tests for Combinational Circuits

Kalyana Kantipudi, Kalyana R. Kantipudi, 2007 .