I. De Wolf

发表

A. Witvrouw, J. De Coster, L. Haspeslagh, 2008, International Symposium on Laser Metrology.
I. De Wolf, 2004, 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716).
I. De Wolf, A. Ghisi, S. Kalicinski, 2008, EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems.
M. Gonzalez, E. Beyne, G. Van der Plas, 2013, 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
I. De Wolf, D. Degryse, Jian Chen, 2004, IEEE Transactions on Components and Packaging Technologies.
I. De Wolf, Jian Chen, 2005, IEEE Transactions on Components and Packaging Technologies.
M. Gonzalez, J. Vanfleteren, I. De Wolf, 2011, IEEE Transactions on Components, Packaging and Manufacturing Technology.
A. Witvrouw, J. De Coster, L. Haspeslagh, 2008, International Symposium on Laser Metrology.
R. Degraeve, I. De Wolf, G. Groeseneken, 1994, Proceedings of 1994 IEEE International Reliability Physics Symposium.
W. De Raedt, I. De Wolf, X. Rottenberg, 2008, EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems.
E. Beyne, I. De Wolf, A. Ivankovic, 2012, 2012 IEEE 14th Electronics Packaging Technology Conference (EPTC).
A. Witvrouw, S. Severi, J. De Coster, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
E. Beyne, G. Van der Plas, I. De Wolf, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
A. Witvrouw, J. De Coster, I. De Wolf, 2011, 2011 IEEE 61st Electronic Components and Technology Conference (ECTC).
P. Soussan, E. Beyne, P. De Moor, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
R. Rooyackers, I. De Wolf, F. Nouri, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
E. Beyne, I. De Wolf, B. Vandevelde, 2009, 2009 15th International Workshop on Thermal Investigations of ICs and Systems.
P. Soussan, E. Beyne, A. Mercha, 2010, 2010 Symposium on VLSI Technology.
E. Beyne, G. Van der Plas, I. De Wolf, 2011, 2011 IEEE 13th Electronics Packaging Technology Conference.
E. Beyne, I. De Wolf, K. Croes, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).
I. De Wolf, I. De Wolf, Jian Chen, 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).
I. De Wolf, K. Croes, Y. Li, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).
I. De Wolf, A. Ivankovic, V. Cherman, 2014, 2014 IEEE 64th Electronic Components and Technology Conference (ECTC).
C. Van Hoof, A. Witvrouw, J. De Coster, 2008, EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium.
I. De Wolf, R. Puers, S. Stoffels, 2009, TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference.
R. Degraeve, I. De Wolf, G. Groeseneken, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).
R. Rooyackers, I. De Wolf, H. Bender, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
S. Brebels, W. De Raedt, I. De Wolf, 2007, TRANSDUCERS 2007 - 2007 International Solid-State Sensors, Actuators and Microsystems Conference.
W. De Raedt, I. De Wolf, X. Rottenberg, 2007, Journal of Microelectromechanical Systems.
E. Beyne, A. Witvrouw, I. De Wolf, 2009, TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference.
Bo Wang, S. Decoutere, A. Witvrouw, 2012, Journal of Microelectromechanical Systems.
I. De Wolf, I. De Wolf, 2006, EuroSime 2006 - 7th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems.
P. Soussan, W. De Raedt, I. De Wolf, 2008, 2008 IEEE International Reliability Physics Symposium.
I. De Wolf, M. Wevers, H.A.C. Tilmans, 2008, 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems.
E. Beyne, G. Van der Plas, I. De Wolf, 2017, 2017 IEEE International Electron Devices Meeting (IEDM).
I. De Wolf, K. Maex, A. Steegen, 1998, 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).
I. De Wolf, S.K. Jones, A. Poncet, 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.
I. De Wolf, R. Puers, P. Czarnecki, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
E. Beyne, G. Van der Plas, I. De Wolf, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).
P. Soussan, W. De Raedt, I. De Wolf, 2008, 2008 IEEE 21st International Conference on Micro Electro Mechanical Systems.
I. De Wolf, B. Vandevelde, P. Ratchev, 2004, IEEE Transactions on Device and Materials Reliability.
E. Beyne, I. De Wolf, K. Croes, 2013, 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
I. De Wolf, M. Tack, P. Moens, 2007, 2007 IEEE International Electron Devices Meeting.
A. Witvrouw, J. De Coster, I. De Wolf, 2008, 2008 IEEE International Electron Devices Meeting.
A. Witvrouw, I. De Wolf, L. Haspeslagh, 2007, 2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS).
E. Beyne, I. De Wolf, A. Ivankovic, 2014, 2014 15th International Conference on Thermal, Mechanical and Mulit-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE).
A. Witvrouw, J. De Coster, I. De Wolf, 2011, 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference.
E. Beyne, G. Van der Plas, I. De Wolf, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).
I. De Wolf, R. Puers, R. Mertens, 2002, Digest. International Electron Devices Meeting,.
E. Beyne, I. De Wolf, B. Vandevelde, 2009, 2009 11th Electronics Packaging Technology Conference.
J. Vanfleteren, Yung-Yu Hsu, I. De Wolf, 2011, IEEE Transactions on Electron Devices.