Ful-Chiang Wu

发表

Robust Design of Mixing Static and Dynamic Multiple Quality Characteristics

Ful-Chiang Wu, Ful-Chiang Wu, 2015 .

A comparative study on optimization methods for experiments with ordered categorical data

Ful-Chiang Wu, Chi-Hao Yeh, C. Yeh, 2006, Comput. Ind. Eng..

Minimizing the weighted completion time on an integrated single machine scheduling problem with maintenance activities

Fuh-Der Chou, Ful-Chiang Wu, Ya-Chih Tsai, 2018, ICMSR '18.

Validation and evaluation for defect-kill-rate and yield estimation models in semiconductor manufacturing

Ful-Chiang Wu, K.-Y. Chen, C.-H. Chen, 2007 .

Simultaneous Optimization of Robust Design with Quantitative and Ordinal Data

Ful-Chiang Wu, F. Wu, Ful-Chiang Wu, 2008 .

An Image Enhancement Technique in Inspecting Visual Defects of Polarizers in TFT-LCD Industry

Ful-Chiang Wu, Chi-Hao Yeh, C. Yeh, 2009, 2009 International Conference on Computer Modeling and Simulation.

A breakthrough product R&D model by using the integration of four-phases QFDs and TRIZ

Ful-Chiang Wu, Chien-Yi Huang, Chi-Hao Yeh, 2011, Proceedings of 2011 International Conference on Modelling, Identification and Control.

Optimisation of Multiple Quality Characteristics Based on Percentage Reduction of Taguchi’s Quality Loss

Ful-Chiang Wu, 2002 .

A Wavelet-Based Approach in Detecting Visual Defects on Semiconductor Wafer Dies

Ful-Chiang Wu, Chien-Yi Huang, Chi-Hao Yeh, 2010, IEEE Transactions on Semiconductor Manufacturing.

Robust design of nonlinear multiple dynamic quality characteristics

Ful-Chiang Wu, Ful-Chiang Wu, 2009, Comput. Ind. Eng..

Validation of kill-rate and yield model for clustering visual defects in semiconductor manufacturing

Ful-Chiang Wu, Chi-Hao Yeh, Cheng-Hsiung Chen, 2005, 2005 IEEE International Conference on Industrial Technology.

Validation ofkill-rate andyield modelforclustering visual defects insemiconductor manufacturing

Ful-Chiang Wu, Chi-Hao Yeh, Rei-Lung Lai, 2005 .