P. Olivo
发表
M. Lanzoni,
B. Ricco,
M. Favalli,
1993,
ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures.
B. Ricco,
M. Favalli,
P. Olivo,
1991,
[1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications.
P. Olivo,
F. Irrera,
A. Chimenton,
2007,
IEEE Transactions on Electron Devices.
B. Ricco,
M. Favalli,
P. Olivo,
1993,
Proceedings ETC 93 Third European Test Conference.
P. Olivo,
M. Favalli,
B. Riccò,
1991,
J. Electron. Test..
B. Ricco,
M. Favalli,
P. Olivo,
1989,
[1989] Proceedings of the 1st European Test Conference.
C. Zambelli,
P. Olivo,
G. Koebernik,
2013,
IEEE Electron Device Letters.
P. Olivo,
A. Modelli,
A. Chimenton,
2000,
30th European Solid-State Device Research Conference.
B. Ricco,
M. Favalli,
P. Olivo,
1993,
1993 European Conference on Design Automation with the European Event in ASIC Design.
C. Zambelli,
A. Pirovano,
P. Olivo,
2008,
2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design.
G. Cibrario,
C. Zambelli,
E. Nowak,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
C. Zambelli,
P. Olivo,
G. Koebernik,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
B. Ricco,
M. Favalli,
P. Olivo,
1993,
Proceedings ETC 93 Third European Test Conference.
C. Zambelli,
P. Olivo,
A. Chimenton,
2011,
IEEE Transactions on Electron Devices.
P. Olivo,
A. Chimenton,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
P. Olivo,
F. Irrera,
A. Chimenton,
2006,
Microelectron. Reliab..
P. Olivo,
L. Vendrame,
S. Mennillo,
2007,
2007 Ph.D Research in Microelectronics and Electronics Conference.
B. Ricco,
M. Favalli,
P. Olivo,
1993,
1993 European Conference on Design Automation with the European Event in ASIC Design.
P. Olivo,
A. Bogliolo,
2002,
Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects.
C. Zambelli,
P. Olivo,
A. Chimenton,
2010,
IEEE Electron Device Letters.
C. Zambelli,
P. Olivo,
A. Chimenton,
2009,
2009 IEEE International Reliability Physics Symposium.
B. Ricco,
P. Olivo,
M. Damiani,
1989,
Proceedings. 'Meeting the Tests of Time'., International Test Conference.
B. Ricco,
M. Favalli,
P. Olivo,
1988,
Proceedings 1988 IEEE International Conference on Computer Design: VLSI.
B. Ricco,
M. Favalli,
P. Olivo,
1991,
[1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications.
M. Lanzoni,
P. Olivo,
R. Bez,
1991,
International Electron Devices Meeting 1991 [Technical Digest].
P. Olivo,
A. Chimenton,
P. Olivo,
2002,
32nd European Solid-State Device Research Conference.
B. Ricco,
M. Favalli,
P. Olivo,
1991,
[1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications.
B. Ricco,
M. Favalli,
P. Olivo,
1989,
[1989] Proceedings of the 1st European Test Conference.
P. Olivo,
Gaetano Bellanca,
Stefano Trillo,
2006
.
C. Zambelli,
P. Olivo,
A. Chimenton,
2009,
2009 IEEE International Reliability Physics Symposium.
B. Ricco,
M. Favalli,
P. Olivo,
1989,
Proceedings 1989 IEEE International Conference on Computer Design: VLSI in Computers and Processors.
P. Olivo,
F. Irrera,
A. Chimenton,
2006,
2006 21st IEEE Non-Volatile Semiconductor Memory Workshop.
P. Olivo,
A. Chimenton,
P. Olivo,
2003
.
P. Olivo,
A. Chimenton,
P. Olivo,
2003
.
B. Ricco,
P. Olivo,
J. Sune,
1991,
IEEE Electron Device Letters.
C. Zambelli,
P. Olivo,
V. Milo,
2019,
APL Materials.
D. Ielmini,
P. Olivo,
A. Visconti,
2002,
Digest. International Electron Devices Meeting,.
P. Olivo,
Bruno Ricco,
Thao N. Nguyen,
1988
.
C. Zambelli,
P. Olivo,
P. Olivo,
2013,
IEEE Electron Device Letters.
P. Olivo,
A. Chimenton,
P. Olivo,
2006,
IEEE Transactions on Electron Devices.
P. Olivo,
Bruno Ricco,
Tung-Sheng Kuan,
1987
.
B. Ricco,
P. Olivo,
B. Riccò,
1991
.
P. Olivo,
Thao N. Nguyen,
B. Ricco',
1987,
25th International Reliability Physics Symposium.
B. Ricco,
P. Olivo,
E. Sangiorgi,
1985,
IEEE Electron Device Letters.
C. Zambelli,
P. Olivo,
A. Grossi,
2017,
IEEE Electron Device Letters.
C. Zambelli,
P. Olivo,
A. Chimenton,
2008,
2008 9th Annual Non-Volatile Memory Technology Symposium (NVMTS).
B. Ricco,
P. Olivo,
M. Damiani,
1993,
Proceedings ETC 93 Third European Test Conference.